Determination of iron impurity in industrial silicon by inductively coupled plasma atomic emission spectrometry with microwave digestion
ZHAO Jianfeng, LI Weijie, WANG Yueqiang, YANG Yongtao
Metallurgical Analysis . 2026, (3): 82 -87 .  DOI: 10.13228/j.boyuan.issn1000-7571.012944

Copyright © Metallurgical Analysis, All Rights Reserved.
Tel: 010-62182398　
E-mail：yjfx@analysis.org.cn
Powered by Beijing Magtech Co. Ltd,.