Application of focused ion beam dual-beam scanning electron microscope in fracture crack analysis
ZOU Yongchun, SUN Jiashuo, SHAO Dihua, DI Yue, WANG Shuqi CHEN Guoliang, YE Zhiyun, WANG Yaming
Metallurgical Analysis . 2026, (1): 63 -71 .  DOI: 10.13228/j.boyuan.issn1000-7571.013163

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