Application of focused ion beam dual-beam scanning electron microscope in fracture crack analysis

ZOU Yongchun, SUN Jiashuo, SHAO Dihua, DI Yue, WANG Shuqi CHEN Guoliang, YE Zhiyun, WANG Yaming

Metallurgical Analysis ›› 2026, Vol. 46 ›› Issue (1) : 63-71.

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Metallurgical Analysis ›› 2026, Vol. 46 ›› Issue (1) : 63-71. DOI: 10.13228/j.boyuan.issn1000-7571.013163
Ferrous Metallurgy

Application of focused ion beam dual-beam scanning electron microscope in fracture crack analysis

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2026, 46(1): 63-71 https://doi.org/10.13228/j.boyuan.issn1000-7571.013163

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