Application of focused ion beam-scanning electron microscopy double beam system in the characterization of inclusions in alloy steel
LU Chaochao, SUN Xuejiao, FANG Jinlin, DONG Bingcheng, WU Hongjian
Metallurgical Analysis . 2025, (2): 10 -17 .  DOI: 10.13228/j.boyuan.issn1000-7571.012439

Copyright © Metallurgical Analysis, All Rights Reserved.
Tel: 010-62182398　
E-mail：yjfx@analysis.org.cn
Powered by Beijing Magtech Co. Ltd,.