Application of focused ion beam-scanning electron microscopy double beam system in the characterization of inclusions in alloy steel

LU Chaochao, SUN Xuejiao, FANG Jinlin, DONG Bingcheng, WU Hongjian

Metallurgical Analysis ›› 2025, Vol. 45 ›› Issue (2) : 10-17.

Metallurgical Analysis ›› 2025, Vol. 45 ›› Issue (2) : 10-17. DOI: 10.13228/j.boyuan.issn1000-7571.012439

Application of focused ion beam-scanning electron microscopy double beam system in the characterization of inclusions in alloy steel

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2025, 45(2): 10-17 https://doi.org/10.13228/j.boyuan.issn1000-7571.012439

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