Abstract：The indium in slag was determined by a portable energy dispersive X ray fluorescence spectrometer using electric refrigerating Si PIN semiconductor detector and 241Am as excitation source. The effect of main matrix elements in sample including Fe, Cu, Pb and Zn was discussed. A mathematical model was established to correct the matrix effect by combining special bulk ratio method and simple regression. The self made sample was repeatedly determined using portable energy dispersive X ray fluorescence spectrometer for 20 times. The measurement results showed that the standard deviation was 24.5 μg/g and the relative standard deviation (RSD) was 6.4%, so the instrument was under normal working conditions. The determination results of some self made samples were compared with those obtained by chemical analysis method. The minimum relative error was 0.35 %, and the measurement result of instrument was 0.158 %. The maximum relative error was 26.06 %, and the measurement result of instrument was 0.023 %.
郭龙滨;赖万昌;张永涛;何大志. 便携式能量色散X射线荧光仪测定矿渣中铟[J]. 冶金分析, 2011, 31(1): 19-22.
GUO Long bin;LAI Wan chang;ZHANG Yong tao;et al.. Determination of indium in slag using portable energy dispersive X ray fluorescence spectrometer. , 2011, 31(1): 19-22.
