Determination of eight impurity elements  in industrial silicon by inductively coupled plasma atomic emission spectrometry

Determination of eight impurity elements in industrial silicon by inductively coupled plasma atomic emission spectrometry

ZHANG Yun-hui, YANG Xiao-jing ,KANG Ruo-gu, ZHAO Jian-wei, JIN Bo

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Metallurgical Analysis ›› 2013, Vol. 33 ›› Issue (2) : 55-59.

Determination of eight impurity elements in industrial silicon by inductively coupled plasma atomic emission spectrometry

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2013, 33(2): 55-59

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