Determination of impurity elements in ferrosilicon by inductively coupled plasma mass spectrometry

KANG De-hua, WANG Tie, YU Yuan-jun, WANG Cui-yan, BAI Xuan

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Metallurgical Analysis ›› 2013, Vol. 33 ›› Issue (10) : 64-68.

Determination of impurity elements in ferrosilicon by inductively coupled plasma mass spectrometry

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2013, 33(10): 64-68

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