A background removing approach based on complex wavelet transform for X-ray fluorescence spectrometry

ZHAO Feng-kui,WANG Ai-min

Metallurgical Analysis ›› 2015, Vol. 35 ›› Issue (7) : 10-14.

PDF(858 KB)
PDF(858 KB)
Metallurgical Analysis ›› 2015, Vol. 35 ›› Issue (7) : 10-14. DOI: 10.13228/j.boyuan.issn1000-7571.140124

A background removing approach based on complex wavelet transform for X-ray fluorescence spectrometry

    {{javascript:window.custom_author_en_index=0;}}
  • {{article.zuoZhe_EN}}
Author information +
History +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

QR code of this article

Cite this article

EndNote

Ris (Procite)

Bibtex

Download Citations
{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2015, 35(7): 10-14 https://doi.org/10.13228/j.boyuan.issn1000-7571.140124

References

List( Publishing order | Descend order by publishing year | Descend order by cited within ) Chart analysis

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}
{{article.copyrightLicense_en}}
PDF(858 KB)

Accesses

Citation

Detail
Sections
Recommended
Copyright © Metallurgical Analysis, All Rights Reserved.
Tel: 010-62182398　
E-mail：yjfx@analysis.org.cn
Powered by Beijing Magtech Co. Ltd,.

/

〈 〉