Focused ion beam technology in materials science: From micro/nanofabrication to multimodal correlative characterization

QIAO Yi, LI Shilei, WANG Yanhua

Metallurgical Analysis ›› 2026, Vol. 46 ›› Issue (1) : 1-23.

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Metallurgical Analysis ›› 2026, Vol. 46 ›› Issue (1) : 1-23. DOI: 10.13228/j.boyuan.issn1000-7571.013177
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Focused ion beam technology in materials science: From micro/nanofabrication to multimodal correlative characterization

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2026, 46(1): 1-23 https://doi.org/10.13228/j.boyuan.issn1000-7571.013177

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