Geometric prior enhanced edge detection algorithm for regular pattern measurement in FIB-SEM nanostructure

WANG Xuxing, CAO Zhenfeng, SUN Wei, QIU Tingting, WANG Xianhao ZHANG Xiaohui, YANG Minglai, WANG Ying

Metallurgical Analysis ›› 2026, Vol. 46 ›› Issue (1) : 95-106.

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Metallurgical Analysis ›› 2026, Vol. 46 ›› Issue (1) : 95-106. DOI: 10.13228/j.boyuan.issn1000-7571.013159
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Geometric prior enhanced edge detection algorithm for regular pattern measurement in FIB-SEM nanostructure

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2026, 46(1): 95-106 https://doi.org/10.13228/j.boyuan.issn1000-7571.013159

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