Application of focused ion beam-scanning electron microscope in shale oil and gas research

ZHANG Lin, WANG Xiaoqi, JIN Xu, FANG Zhengwei WANG Mingwei, BAO Fang, GAO Huanxiang, GAO Haifeng

Metallurgical Analysis ›› 2026, Vol. 46 ›› Issue (1) : 24-36.

PDF(8520 KB)
PDF(8520 KB)
Metallurgical Analysis ›› 2026, Vol. 46 ›› Issue (1) : 24-36. DOI: 10.13228/j.boyuan.issn1000-7571.013135
Review

Application of focused ion beam-scanning electron microscope in shale oil and gas research

    {{javascript:window.custom_author_en_index=0;}}
  • {{article.zuoZhe_EN}}
Author information +
History +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

QR code of this article

Cite this article

EndNote

Ris (Procite)

Bibtex

Download Citations
{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2026, 46(1): 24-36 https://doi.org/10.13228/j.boyuan.issn1000-7571.013135

References

List( Publishing order | Descend order by publishing year | Descend order by cited within ) Chart analysis

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}
{{article.copyrightLicense_en}}
PDF(8520 KB)

Accesses

Citation

Detail
Sections
Recommended
Copyright © Metallurgical Analysis, All Rights Reserved.
Tel: 010-62182398　
E-mail：yjfx@analysis.org.cn
Powered by Beijing Magtech Co. Ltd,.

/

〈 〉