Application of focused ion beam scanning electron microscope in failure analysis of anode cap pickling for glow discharge mass spectrometry

CUI Siyu, YU Xing, LIU Suran, SHEN Yixuan, ZHAO Lei, WANG Haizhou

Metallurgical Analysis ›› 2026, Vol. 46 ›› Issue (1) : 37-45.

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Metallurgical Analysis ›› 2026, Vol. 46 ›› Issue (1) : 37-45. DOI: 10.13228/j.boyuan.issn1000-7571.013111
Ferrous Metallurgy

Application of focused ion beam scanning electron microscope in failure analysis of anode cap pickling for glow discharge mass spectrometry

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2026, 46(1): 37-45 https://doi.org/10.13228/j.boyuan.issn1000-7571.013111

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