Application of focused ion beam double-beam system in the analysis of surface black spot defect of galvanized product

SUN Xuejiao

Metallurgical Analysis ›› 2025, Vol. 45 ›› Issue (5) : 26-33.

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Metallurgical Analysis ›› 2025, Vol. 45 ›› Issue (5) : 26-33. DOI: 10.13228/j.boyuan.issn1000-7571.012713

Application of focused ion beam double-beam system in the analysis of surface black spot defect of galvanized product

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2025, 45(5): 26-33 https://doi.org/10.13228/j.boyuan.issn1000-7571.012713

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