Determination of trace silicon in high-purity tantalum, high-purity tungsten and high-purity molybdenum by inductively coupled plasma tandem mass spectrometry

WANG Zhiqing, HOU Yanxia, YANG Guowu, QI Rong, QIAO Lili, LOU Jinhui

Metallurgical Analysis ›› 2023, Vol. 43 ›› Issue (8) : 31-37.

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Metallurgical Analysis ›› 2023, Vol. 43 ›› Issue (8) : 31-37. DOI: 10.13228/j.boyuan.issn1000-7571.012029

Determination of trace silicon in high-purity tantalum, high-purity tungsten and high-purity molybdenum by inductively coupled plasma tandem mass spectrometry

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2023, 43(8): 31-37 https://doi.org/10.13228/j.boyuan.issn1000-7571.012029

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