Discussion on interference and correction method during the analysis of trace silicon in complex superalloy by inductively coupled plasma atomic emission spectrometry

LIU Xiao-bo, YANG Guo-wu, HOU Yan-xia, QI Rong, LIU Qing-bin, HU Jing-yu

Metallurgical Analysis ›› 2018, Vol. 38 ›› Issue (7) : 12-19.

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Metallurgical Analysis ›› 2018, Vol. 38 ›› Issue (7) : 12-19. DOI: 10.13228/j.boyuan.issn1000-7571.010390

Discussion on interference and correction method during the analysis of trace silicon in complex superalloy by inductively coupled plasma atomic emission spectrometry

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2018, 38(7): 12-19 https://doi.org/10.13228/j.boyuan.issn1000-7571.010390

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