Fault analysis and treatment for circuit board ofX-ray fluorescence spectrometry

WANG Ming-li,CUI Quan-fa,FEI Shu-mei,SUN Juan,YAN Li,XIA Bi-feng

Metallurgical Analysis ›› 2018, Vol. 38 ›› Issue (2) : 38-41.

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Metallurgical Analysis ›› 2018, Vol. 38 ›› Issue (2) : 38-41. DOI: 10.13228/j.boyuan.issn1000-7571.010178

Fault analysis and treatment for circuit board ofX-ray fluorescence spectrometry

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2018, 38(2): 38-41 https://doi.org/10.13228/j.boyuan.issn1000-7571.010178

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