Determination of eleven micro elements in industrial silicon by X-ray fluorescence spectrometry

BAI Wan-li, ZHANG Ai-fen, SHI Lei, MA Hui-xia, LIU Jing

Metallurgical Analysis ›› 2016, Vol. 36 ›› Issue (10) : 40-46.

PDF(861 KB)
PDF(861 KB)
Metallurgical Analysis ›› 2016, Vol. 36 ›› Issue (10) : 40-46. DOI: 10.13228/j.boyuan.issn1000-7571.009815

Determination of eleven micro elements in industrial silicon by X-ray fluorescence spectrometry

    {{javascript:window.custom_author_en_index=0;}}
  • {{article.zuoZhe_EN}}
Author information +
History +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

QR code of this article

Cite this article

EndNote

Ris (Procite)

Bibtex

Download Citations
{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2016, 36(10): 40-46 https://doi.org/10.13228/j.boyuan.issn1000-7571.009815

References

List( Publishing order | Descend order by publishing year | Descend order by cited within ) Chart analysis

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}
{{article.copyrightLicense_en}}
PDF(861 KB)

Accesses

Citation

Detail
Sections
Recommended
Copyright © Metallurgical Analysis, All Rights Reserved.
Tel: 010-62182398　
E-mail：yjfx@analysis.org.cn
Powered by Beijing Magtech Co. Ltd,.

/

〈 〉