微波消解-电感耦合等离子体原子发射光谱法测定工业硅中杂质铁
赵建峰, 李伟杰, 王跃强, 杨永韬
Determination of iron impurity in industrial silicon by inductively coupled plasma atomic emission spectrometry with microwave digestion
ZHAO Jianfeng, LI Weijie, WANG Yueqiang, YANG Yongtao
冶金分析
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2026, (3): 82
-87
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DOI: 10.13228/j.boyuan.issn1000-7571.012944
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