火花放电原子发射光谱仪分析高含量硅时校准曲线的扩展与应用
吴振, 喻能利, 蔡璐, 李永武, 嵇龙, 沈广强
Extension and application of calibration curve for the analysis ofhigh content silicon by spark discharge atomic emission spectrometry
WU Zhen, YU Neng-li, CAI Lu, LI Yong-wu, JI Long, SHEN Guang-qiang
冶金分析
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2019, (1): 59
-63
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DOI: 10.13228/j.boyuan.issn1000-7571.010430
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