电感耦合等离子体原子发射光谱法测定高含量碳化硅表面6种杂质成分

卞大勇

Determination of six impurity components on surface of high-content silicon carbide by inductively coupled plasma atomic emission spectrometry

BIAN Da-yong

冶金分析 . 2018, (5): 72 -77 . DOI: 10.13228/j.boyuan.issn1000-7571.010286