全自动制样-X射线荧光光谱法测定硅铁中硅
张东雯, 任娟玲, 杨蒙, 李康
Determination of silicon in ferrosilicon by X-ray fluorescence spectrometry after fully-automatic sample preparation
ZHANG Dong-wen, REN Juan-ling, YANG Meng, LI Kang
冶金分析
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2016, (8): 25
-29
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DOI: 10.13228/j.boyuan.issn1000-7571.009853