电感耦合等离子体原子发射光谱法测定工业硅中8种杂质元素

张云晖，杨晓静，亢若谷，赵建为，金波

Determination of eight impurity elements in industrial silicon by inductively coupled plasma atomic emission spectrometry

ZHANG Yun-hui, YANG Xiao-jing ,KANG Ruo-gu, ZHAO Jian-wei, JIN Bo

冶金分析 . 2013, (2): 55 -59 .