Abstract：A determination method of silicon dioxide in copper concentrate and lead concentrate by inductively coupled plasma atomic emission spectrometry (ICP-AES) was developed. The sample was melted at high temperature in corundum crucible using sodium peroxide as flux. The fusion cake was leached with hot water and acidified with hydrochloric acid. After matrix dilution, the internal standard element Au was added. The effects of matrix and instrumental fluctuation could be effectively eliminated using internal standard calibration method. The detection limit of silicon dioxide in this method was 0.0063 μg/mL, and the determination range (mass fraction) was 0.02 %-10 %. The proposed method had been applied to the determination of certified reference materials of copper concentrate and lead concentrate. The determination results were in good agreement with the certified values, and the RSD（n=5) was less than 3 %.
