Analysis on key points for K factor measurement during quantification of carbon by ZAF
ZHANG Xiaofeng1, HU Jinsheng2, LI Ming3, LAN Jianglin4, ZHOU Zihao3, ZHOU Guangxue5
1. Central Iron and Steel Research Institute Co.,Ltd.,Beijing 100081,China; 2. JEOLBEIJING Co.,Ltd., Beijing 100089,China; 3. Analytical Center,Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences,Ningbo 315201,China; 4. NCS Testing Technology Co.,Ltd.,Beijing 100081,China; 5. Key Laboratory of Marine Materials and Related Technologies,Ningbo Institute of Materials Technology and Engineering,Chinese Academy of Sciences,Ningbo 315201,China
Abstract：The quantitative analysis of ultralight elements is always one of difficulties in the application field of electron probe microanalysis (EPMA). In this paper, carbon was selected as an example, and CrTiAlC magnetron sputtering material was used as a sample, then several key points for accurate measurement of K factor of ultralight element were analyzed according to the quantitative analysis process of ZAF. Proper methods for background deduction were discussed through the qualitative spectra of analytical element. Graphite and diamond were selected as certified reference materials of carbon. The quantitative analysis results were compared to discuss the importance of selection of certified reference materials. Moreover, how to properly use the pulse height analyzer (PHA) for peak filtering was also discussed in case of overlapping peak interference.
张晓峰, 胡晋生, 李明, 兰江林, 周子浩, 周广学. ZAF定量碳元素时K因子测量的要点解析[J]. 冶金分析, 2024, 44(9): 72-76.
ZHANG Xiaofeng, HU Jinsheng, LI Ming, LAN Jianglin, ZHOU Zihao, ZHOU Guangxue. Analysis on key points for K factor measurement during quantification of carbon by ZAF. , 2024, 44(9): 72-76.
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