Abstract：Quartz reflector is commonly used as sample carrier in total reflection X-ray fluorescence (TXRF) spectroscopy analysis. At present, the commercial quartz reflectors of TXRF are all imported products, and the batch purchase cost is often unbearable as the unit price is too high. Therefore, our project team screened several domestic manufacturers and appointed them to customize a batch of home-made quartz reflectors with the specified technical parameters. The unit price was even lower than 1/15 of the imported products. In order to investigate the performance difference between home-made and imported products, two kinds of quartz reflectors were employed for measurement by TXRF under the same conditions. By comparing the regions of interest (spectral background (BG), Si, Ar and Mo) and the limits of detection of different elements (V, Cr, Mn, Co, Ni, Cu, Zn, As, Sr, Ba, Pb and Bi), the differences of physical properties such as material purity, flatness and thickness of two kinds of quartz reflectors were investigated and evaluated. Five mixed standard solutions with different mass concentrations were tested by TXRF using the home-made and imported quartz reflectors. By comparing the sensitivity and measured values of different elements obtained by two reflectors, the differences in usage performance were investigated and evaluated. The experimental results showed that the measurements results obtained by two kinds of quartz reflectors were almost the same, which proved that the performance index of home-made quartz reflectors had been very similar to that of imported quartz reflectors. The home-made quartz reflectors could completely replace the imported ones. The use of home-made quartz reflectors could greatly reduce the cost and facilitate the field sample analysis.
[1] 克洛肯凯帕.全反射X射线荧光分析[M].王晓红,王毅民,王永奉,译.北京:原子能出版社,2002. [2] Cherkashina T Y,Panteeva S V,Finkelshtein A L,et al.Determination of Rb,Sr,Cs,Ba and Pb in K-feldspars in small sample amounts by total reflection X-ray fluorescence[J].X-ray Spectrometry,2013,42(4):207-212. [3] Towett E K,Shepherd K D,Cadisch G.Quantification of total element concentrations in soils using total X-ray fluorescence spectroscopy(TXRF)[J].Science of The Total Environment,2013,463-464:374-388. [4] Bilo F,Borgese L,Dalipi R,et al.Elemental analysis of tree leaves by total reflection X-ray fluorescence:New approaches for air quality monitoring[J].Chemosphere,2017,178:504-512. [5] Pepponi G,Lazzeri P,Coghe N,et al.Total reflection X-ray fluorescence analysis of pollen as an indicator for atmospheric pollution[J]. Spectrochimica Acta Part B,2004,59(8):1205-1209. [6] 王江雪,郭兰英,金立云,等.大气颗粒物的TXRF分析技术研究[J].南华大学学报(理工版),2004,18(1):63-66. WANG Jiangxue,GUO Lanying,JIN Liyun,et al.Research of the technology of TXRF analysis in airborne particulate matter[J].Journal of Nanhua University(Science & Engineering Edition),2004,18(1):63-66. [7] Calle I D L,Quade M,Krugmann T,et al.Determination of residual metal concentration in metallurgical slag after acid extraction using total reflection X-ray fluorescence spectrometry[J].X-Ray Spectrometry,2014,43(6):345-352. [8] Antosz F J,Xiang Y,Diaz A R,et al.The use of total reflectance X-ray fluorescence (TXRF) for the determination of metals in the pharmaceutical industry[J].Journal of Pharmaceutical and Biomedical Analysis,2012,62:17-22. [9] Salomone V N,Riera M,Cerchietti L,et al.Seasonal determination of trace and ultra-trace content in Macrocystis pyrifera from San Jorge Gulf (Patagonia) by total reflection X-ray fluorescence[J].Spectrochimica Acta Part B,2017,131:74-78. [10] Dasilva E,David A M,Pejović-Milić A.The quantification of total lead in lipstick specimens by total reflection X-ray fluorescence spectrometry[J].X-Ray Spectrometry,2015,44(6):451-457. [11] 王谦,郑琳,任飞,等.悬浮液进样-全反射X射线荧光光谱法测定膏霜类化妆品中的铅、砷和汞[J].分析化学,2018,46(4):517-523. WANG Qian,ZHENG Lin,REN Fei,et al.Determination of lead,arsenic and mercury in cream cosmetics by total reflection X-ray fluorescence spectrometry using suspension sampling[J].Chinese Journal of Analytical Chemistry,2018,46(4):517-523. [12] Cleto D A M,Andrello A C,Nettoí J V,et al.Analysis of saliva and gingival crevice fluid by total reflection X-ray fluorescence (TXRF)[J]. X-Ray Spectrometry,2016,45(4):220-224. [13] 乔亚华,杨阳, 王博,等.全反射X射线荧光分析技术在核科学领域中的应用[J].核电子学与探测技术,2012,32(11):1263-1268. QIAO Yahua,YANG Yang,WANG Bo,et al.Application of TXRF analysis in nuclear science[J].Nuclear Electronics & Detection Technology,2012,32(11):1263-1268.
