Effect of sample preparation method on the determination of twenty-seven impurity elements in boron nitride by direct current glow discharge mass spectrometry
TAN Xiu-zhen1, LI Yao1, ZHU Liu1, DENG Yu-ning2
1. Guangdong First Rare Materials Co., Ltd., National Engineering and Technology Research Center of Scattered Metal, Qingyuan 511875, China; 2. Qingyuan First Materials Co., Ltd., Qingyuan 511517, China
Abstract:The influence of three sample preparation methods on the determination of twenty-seven impurity elements (including Na, Mg, Al, Si, etc) in boron nitride by direct current glow discharge mass spectrometry (dc-GDMS) was discussed. Three sample preparation methods were described as below. Method 1: the boron nitride was directly pressed on the thin sheet of indium; Method 2: after pressing boron nitride on the thin sheet of indium, a layer of indium cover was added; Method 3: the crushed boron nitride was placed on the needle-like tantalum spoon. The influence of three sample preparation methods on the signal intensity of matrix was compared under optimized glow discharge parameters. The results showed that: for Method 1, when the size of boron nitride was about 3mm×3mm with thickness less than 1mm, the signal intensity of matrix (11B) was up to 1.8×107 cps; for Method 2, if the hole size of indium cover was appropriate, the signal intensity of matrix (11B) reached 1.0×107 cps; for Method 3, the signal intensity of matrix was one order of magnitude higher than above two methods. The analytical results were good for most elements under moderate resolution mode. For the elements which were difficult to be separated at high resolution, the isotopes with low abundance could be selected for determined at moderate resolution mode, for example, 70Ge+ for Ge, 82Se+ for Se, 111Cd+ for Cd, 119Sn+ for Sn, 109Ag+ for Ag, and 104Pt+ for Pt. The content of impurity elements in boron nitride could be calculated by subtracting the results of impurities measured from the indium sheet or tantalum spoon. The sample was determined independently for five times, and the relative standard deviations (RSD) were all less than 20%. The analysis results of Al, Si and Ti were basically consistent for three sample preparation methods. In Method 1 and Method 2, the content of detected indium was relatively high, leading to high influence of Ni and Cu in indium on the determination of boron nitride. In Method 3, due to the contribution of Fe and Cu in tantalum, the detected values of Fe and Cu in boron nitride were relatively high. However, the signal intensity of matrix in Method 3 was high, which could reduce the detection limits of some elements such as Cr, Mn, Ga and Ge. Therefore, the Method 3 was the preferred method.
谭秀珍, 李瑶, 朱刘, 邓育宁. 不同制样方法对直流辉光放电质谱法测定氮化硼中27种杂质元素的影响[J]. 冶金分析, 2019, 39(8): 23-29.
TAN Xiu-zhen, LI Yao, ZHU Liu, DENG Yu-ning. Effect of sample preparation method on the determination of twenty-seven impurity elements in boron nitride by direct current glow discharge mass spectrometry. , 2019, 39(8): 23-29.
孙士文,刘从峰,方维政,等.采用不同材料坩埚对碲锌镉晶体质量的影响[J].激光与红外,2007,37(suppl.):924-927.SUN Shi-wen,LIU Cong-feng,FANG Wei-zheng,et al.The qualities of cadium zinc telluride single crystals grown from different materials crucibles[J].Laser & Infrared,2007,37(suppl.):924-927.
[2]
吴敬尧,朱世富,赵北君,等.坩埚材料对生长CdSiP2晶体表面的影响研究[J].人工晶体学报,2015,44(12):3617-3621.WU Jing-yao,ZHU Shi-fu,ZHAO Bei-jun,et al.Effect of crucible materials on the surface of CdSiP2 crystal[J].Journal of Synthetic Crystals,2015,44(12):3617-3621.
[3]
赵墨田,曹永明,陈刚,等.无机质谱概论[M].北京:化学工业出版社,2006.
[4]
陈刚,葛爱景,卓尚军,等.辉光放电质谱法在无机非金属材料分析中的应用[J].分析化学评述与进展,2004,32(1):107-112.CHEN Gang,GE Ai-jing,ZHUO Shang-jun,et al.Analytical application of glow discharge mass spectrometry for non-metal inorganic materials[J].Chinese Journal of Analytical Chemistry,2004,32(1):107-112.
[5]
张萍,符靓,刘宏伟.直流辉光放电质谱法测定海绵钛中杂质元素[J].冶金分析,2016,36(8):7-12.ZHANG Ping,FU Liang,LIU Hong-wei.Determination of impurity elements in titanium sponge by direct current glow discharge mass spectrometry[J].Metallurgical Analysis,2016,36(8):7-12.
[6]
Sabatino M D.Detection limits for glow discharge mass spectrometry (GDMS) analyses of impurities in solar cell silicon[J].Measurement,2014,50:135-140.
[7]
Hoffmann V,Kasik M,Robinso P K,et al.Glow discharge mass spectrometry[J].Anal.Bioanal.Chem.,2005,381:173-188.
[8]
刘元元,胡净宇.辉光放电质谱法测定高纯镁中12种杂质元素[J].冶金分析,2018,38(4):16-21.LIU Yuan-yuan,HU Jing-yu.Determination of twelve impurities in rodlike high-purity magnesium by glow discharge mass spectrometry[J].Metallurgical Analysis,2018,38(4):16-21.
[9]
杨海岸,罗舜,刘英波,等.辉光放电质谱法测定高纯锌中痕量杂质元素[J].云南冶金,2017,46(2):126-131.YANG Hai-an,LUO Shun,LIU Ying-bo,et al.The determination on trace impurity element in high purity zinc by glow-discharge mass spectrometry[J].Yunnan Metallurgy,2017,46(2):126-131.
[10]
刘宏伟,符靓,孙爱明,等.辉光放电质谱法测定镍锌铁氧体材料中的杂质元素[J].分析化学,2015,43(9):1366-1370.LIU Hong-wei,FU Liang,SUN Ai-ming,et al.Determination of impurity elements in nickel-zinc ferrites materials by glow discharge mass spectrometry[J].Chinese Journal of Analytical Chemistry,2015,43(9):1366-1370.
[11]
胡芳菲,王长华,李继东.直流辉光放电质谱法测定氧化镧中25种杂质元素[J].冶金分析,2014,34(3):24-29.HU Fang-fei,WANG Chang-hua,LI Ji-dong.Determination of twenty-five impurity elements in high purity lanthanum oxide by direct current glow discharge mass spectrometry[J].Metallurgical Analysis,2014,34(3):24-29.
[12]
Inoue M,Saka T.Elemental analysis of powders by glow discharge mass spectrometry[J].Analytica Chimica Acta,1999,395:165-171.
[13]
谭秀珍,李瑶,林乾彬,等.直流辉光放电质谱分析导体和非导体样品的高纯铟片状制样方法研究[J].冶金分析,2018,38(9):1-7.TAN Xiu-zhen,LI Yao,LIN Qian-bin,et al.Investigation on sample preparation method of high purity indium sheet in analysis of conductor and non-conductor sample by direct current glow discharge mass spectrometry[J].Metallurgical Analysis,2018,38(9):1-7.
[14]
SIQIN Bilige,QIAN Rong,ZHUO Shang-jun,et al.Studies of rare earth elements to distinguish nephrite samples from different deposits using direct current glow discharge mass spectrometry[J].J.Anal.At.Spectrom.,2014,29:2064-2071.
[15]
余兴,李小佳,王海舟.辉光放电质谱分析中质谱干扰及其校正方法的现状[J].理化检验:化学分册,2010,46(2): 206-210.YU Xing,LI Xiao-jia,WANG Hai-zhou.Mass spectral interferences in glow discharge mass spectrometry and present status of methods for their corrections[J].Physical Testing and Chemical Analysis Part B:Chemical Analysis,2010,46(2):206-210.
[16]
ASTM F1593-97 Standard test method for trace metallic impurities in electronic grade aluminum by high mass-resolution glow-discharge mass spectrometer[S].