Abstract:The rapid determination method of silicon in ferrosilicon by X-ray fluorescence spectrometry (XRF) after fully-automatic sample preparation was established. The effect of several grinding aids (including specific grinding aid for XRF analysis, imported grinding aid, microcrystalline cellulose and stearic acid) on pressed ferrosilicon sample was compared. The specific grinding aid for XRF analysis was selected as additive for sample preparation of ferrosilicon. The addition ratio of sample and grinding aid was 9:1 (mass ratio). During the preparation of ferrosilicon sample by fully-automatic machine, the initial particle size of sample should pass through 160-mesh screen (particle size of 96 μm). The grinding time was 130 s, the pressure was 35 t and the pressure keeping time was 20 s. The ferrosilicon sample with uniform and dense structure and smooth surface could be obtained. Several production samples from different stages were combined as one control sample, which was used to prepare calibration curve with purchased ferrosilicon standard sample. The content range of silicon in calibration curve could meet determination requirements. The influence of mineral effect on determination could be effectively eliminated. The proposed method was applied to the determination of silicon in ferrosilicon. The found results were consistent with those obtained by SN/T 1014.1—2001 potassium fluosilicate titration method. The relative standard deviation (RSD, n=11) was less than 0.2%.
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