Abstract：The microstructure of high temperature oxide scale on silicon steel was characterized by electron probe microanalyzer (EPMA) mapping analysis, state analysis and electron backscatter diffraction (EBSD) phase analysis. The element distribution and the initial structure of the oxide scale could be detected by EPMA mapping analysis apparently. And the state of iron in the conventional oxide scales could be determined by state analysis. Meanwhile, the alloy-rich region could be identified by EBSD phase analysis. The results indicated that the microscopic structure of high temperature oxide scale were four layers, containing the outermost layer with 10 μm Fe2O3 phase, the outer layer with Fe3O4 phase, the intermediate layer with granular Fe3O4 phase was embedded in FeO phase, and the innermost layer with FeO phase and Fe2SiO4 phase. The distribution of Fe2SiO4 phase was closely related to the temperature. At 1 100 ℃, granular Fe2SiO4 phase dispersed in FeO layer. At 1 200 ℃, liquid Fe2SiO4 intruding into the substrate and the FeO porosity layer distributed along the grain boundaries of FeO phase.
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WU Yuan-yuan, ZHANG Ke, HONG Hui-min, NIU Ya-hui. Characterization of the microstructure of high temperature oxide scale on silicon steel. , 2014, 34(10): 25-31.
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