Abstract：Abstract: The samples were digested by microwave under optimized digestion procedure with ramped temperature program using mixed acid (VHF∶VHNO3∶VHCl=1∶6∶3) as digestion reagent. After the digestion solution was diluted to the mark with water, the content of fourteen impurities including Si, Al, Mn, P, Cu, Co, Cr, Ni, V, As, Cd, Pb, Ca and Mg was determined by inductively coupled plasma atomic emission spectrometry (ICPAES). The optimal digestion conditions and spectral interference for sample was investigated. The results showed that the optimal digestion procedure was as follows: increasing the temperature to 130 ℃ within 5 min and keeping for 3 min, and then increasing the temperature to 200 ℃ within 5 min and keeping for 10 min. The titanium matrix effect and spectral overlapping interference were eliminated by selecting the proper spectral lines as the analytical lines for testing elements, matrix matching and synchronous background correction method. The detection limit of method was 5 μg/L (Mg)60 μg/L (Si). The background equivalent concentration was 4 μg/L (Mg)55 μg/L (Si). The proposed method was applied to the determination of fourteen impurity elements in titaniumrich material. The relative standard deviation (RSD,n=8) was not larger than 6.5 %, and the recoveries of standard addition were between 95 % and 108 %.
