Abstract：Rare earth elements are important strategic resources, thus the determination of impurity elements in rare earth oxide has been paid more and more attention. The rare earth oxide sample was pressed on indium sheet with high purity metal indium as conductive medium, and a new method for determination of 35 impurity elements in rare earth oxides was established by glow discharge mass spectrometry(GDMS) with appropriate isotopes and resolution. The lanthanum oxide sample was used as the test object to optimize the instrument working parameters, and the conditions were obtained as follows: the discharge current was 40 mA, the gas flow rate was 330 mL/min, the indium sheet was presputtered for 20 min to remove its surface contamination, the rare earth oxide sample was added and presputtered for 12 min before determination. The test parameters of other rare earth oxides could be fine-tuned by referring to lanthanum oxide conditions. The sample preparation conditions were optimized. The sample mass of 10 mg was selected, and the sample preparation method was full coverage.The limits of detection for elements were all less than 0.05 μg/g, and the limits of quantification were all less than 0.1 μg/g.The proposed method was applied to determination of 35 impurity elements in samples of lanthanum oxide, cerium oxide, praseodymium oxide and neodymium oxide. The relative standard deviations (RSD,n=6)of determination result were all less than 25%. Method comparison test was conducted. The determination results of rare earth elements in lanthanum oxide sample by proposed method were basically consistent with those obtained by copper powder pellet-glow discharge mass spectrometry. The determination results of impurity elements in lanthanum oxide sample were all in good agreement with those obtained by inductively coupled plasma mass spectrometry (ICP-MS).This method makes up the shortcomings of difficult to obtain high purity copper powder and complicated pretreatment by ICP-MS.
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