Abstract:Taphole clay is a kind of amorphous functional refractory material. The determination of Fe2O3, Al2O3 and CaO contents is helpful to control the product quality. There are many impurity components in the taphole clay, and the presence of silicon nitride and silicon carbide leads to the difficulty of fusion sample preparation, which limits the application of X-ray fluorescence spectrometry in the analysis of taphole clay materials. In this study, the impurity components were firstly decomposed followed by fusion sample preparation. Lithium hydroxide was used to decompose silicon nitride, while sodium nitrate and barium peroxide were used to decompose silicon carbide. Then lithium tetraborate-lithium metaborate mixed flux was used as the reaction base to isolate reactants and neutralize the excessive strong bases. Finally, the sample was fused to prepare the pieces. A method for the analysis of iron oxide, aluminum oxide and calcium oxide in taphole clay by X-ray fluorescence spectrometry with fusion sample preparation was established. The product of hot alkali reaction was analyzed by oxygen-nitrogen analyzer, and the optimum ratio of taphole clay to lithium hydroxide was determined. The test samples were characterized by blank experiments, contrast experiment, scanning electron microscopy (SEM), X-ray diffraction (XRD) and image Mapping. The results showed that lithium tetraborate could neutralize lithium hydroxide completely after melting at high temperature, and the main product of lithium metaborate was conducive to the analysis by X-ray fluorescence spectrometry. Lithium hydroxide could effectively decompose silicon nitride, avoiding the phenomenon of component aggregation caused by silicon nitride particles. So that the surface of the melt piece was clean and smooth. The contents of iron oxide, aluminum oxide and calcium oxide in taphole clay product samples were determined according to the experimental method, and the relative standard deviations (RSD, n=10) of determination results were between 0.28% and 4.6%. The differences between fluoride replacement EDTA titration method and inductively coupled plasma emission spectrometry method were both within the tolerance range of GB/T 6900-2016.
[1] SR Dash.Development of improved tap hole clay for blast furnace tap hole[D].Rourkela:National institute of technology,2009. [2] 唐艳东,马北越,高陟.高炉炮泥的研究进展[J].耐火材料,2020,54(5):452-456. TANG Yandong,MA Beiyue,GAO Zhi.Latest research progress of taphole clay for blast furnaces[J].Refractories,2020,54(5):452-456. [3] 李军希.高炉炮泥的发展及现状[J].河南冶金,2003,11(3):16-18,26. LI Junxi.The present situation of the taphole clay[J].Henan Metallurgy,2003,11(3):16-18,26. [4] 中华人民共和国国家质量监督检验检疫总局,中国国家标准化管理委员会.GB/T 6900—2016铝硅系耐火材料化学分析方法[S].北京:中国标准出版社,2016. [5] 中华人民共和国国家质量监督检验检疫总局,中国国家标准化管理委员会.GB/T 16555—2017含碳、碳化硅、氮化物耐火材料化学分析方法[S].北京:中国标准出版社,2017. [6] 武振飞,王跃超,陆丽芳,等.无压烧结氮化硅陶瓷的物理性能研究[J].硅酸盐通报,2022,41(5):1782-1787. WU Zhenfei,WANG Yuechao,LU Lifang,et al.Physical properties of silicon nitride ceramics by pressureless sintering[J].Bulletin of the Chinese Ceramic Society,2022,41(5):1782-1787. [7] 王正军.氮化硅陶瓷的研究进展[J].材料科学与工艺,2009,17(2):155-158. WANG Zhengjun.Reswarch progress of silicon nitride ceramic[J].Materials Science and Technology,2009,17(2):155-158. [8] 王珺,刘伟,戴学谦,等.熔融制样X射线荧光光谱法分析铝碳质耐火材料中的多种组分[J].冶金分析,2013,33(3):39-45. WANG Jun,LIU Wei,DAI Xueqian,et al.Analysis of various components in alumina carbon refractory materials with X-ray flurescence spectrometry after sample prearation by fusion[J].Metallurgical Analysis,2013,33(3):39-45. [9] 王彪.颗粒效应对X-射线衍射定量分析准确度的影响[J].中国石油大学学报(自然科学版),1990(4):92-97. WANG Biao.Effect of particle size on XRD′s quantitative analysis accuracy[J].Journal of China University of Petroleum(Edition of Natural Science),1990(4):92-97. [10] 殷宏,王金美.利用二级筛分控制烧结矿粒度效应对X-荧光压片分析法的影响[J].天津冶金,2007(4):41-43. YIN Hong,WANG Jinmei.Influence of 2-step screening grain size control on X-ray fluorescence spectrum analysis[J].Tianjin Metallurgy,2007(4):41-43. [11] 梅燕,马密霞,聂祚仁.X射线荧光光谱法对玻璃上膜层厚度及成分含量的测定[J].光谱学与光谱分析,2013,33(12):3408-3410. MEI Yan,MA Mixia,NIE Zuoren.Determination of film thickness,component and content based on glass surface by using XRF spectrometry[J].Spectroscopy and Spectral Analysis,2013,33(12):3408-3410. [12] 甘婷婷,张玉钧,赵南京,等.样品厚度对薄膜法X射线荧光光谱测量的影响研究[J].光谱学与光谱分析, 2016,36(12):4039-4044. GAN Tingting,ZHANG Yuyun,ZHAO Nanjing,et al.Study of the impact of sample thickness on thin film method X-Ray fluorescence spectrum measurement[J].Spectroscopy and Spectral Analysis,2016,36(12):4039-4044. [13] C O Ingamells.Lithium metaborate flux in silicate analysis[J].Analtica Chimica Acta,1970,52(2):323-334.