Determination of abundance of xenon,germanium,boron and silicon in high abundance stable isotope samples by magnetic mass spectrometry
CAO Jinhao, YANG Fengcheng, HOU Chao, LIU Jialong
Research Institute of Physical and Chemical Engineering of Nuclear Industry,Science and Technology on Particle Transport Separation Laboratory,Tianjin 300180,China
Abstract：The determination of abundance in high abundance gas isotopes is an important step in the production of stable isotope products by centrifugation. In this study, a modified magnetic mass spectrometer was used to analyze the isotopic abundance characterization ions of each gas based on the spectra of xenon gas, germanium tetrafluoride, silicon tetrafluoride, and boron trifluoride after ionization in high abundance isotope samples. The Faraday cup and magnetic field positions were determined based on the motion characteristics of ions in the magnetic field. A mass spectrometry analysis method of isotopic abundance of xenon, germanium, silicon, and boron in high abundance gas stable isotope samples (abundance greater than 99%) xenon,of germanium tetrafluoride, silicon tetrafluoride, and boron trifluoride was established. The measurement results indicated that the isotope with the highest abundance was 124Xe (99.955 4%), with a relative standard deviation (RSD) of 0.002%. The natural abundance of 76Ge in germanium tetrafluoride was concentrated from 7.8% to 99.071%, and the RSD of measurement result of each isotope was not greater than 1.6% (among them, the RSD of high abundance 76Ge was 0.01%). The abundance of 28Si in silicon tetrafluoride reached 99.989 5%, and the RSD of measurement result of each isotope abundance was not greater than 1.4%. The abundance of 11B in boron trifluoride reached 99.975 7%, and the maximum RSD of 10B and 11B isotope abundance measurements was 0.17%. During the detection of abundance of gas stable isotopes, the increase of environment passivation process could effectively reduce the memory effect, especially in the determination of high abundance stable isotopes.
曹金浩, 杨凤诚, 侯超, 刘佳龙. 磁质谱法测定高丰度稳定同位素样品中氙锗硼硅丰度[J]. 冶金分析, 2024, 44(5): 47-53.
CAO Jinhao, YANG Fengcheng, HOU Chao, LIU Jialong. Determination of abundance of xenon,germanium,boron and silicon in high abundance stable isotope samples by magnetic mass spectrometry. , 2024, 44(5): 47-53.
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