Effect of noise fluctuation on trace phase identification in X-ray diffraction technique
CHEN He1, WANG Chunjian*1,2, XU Jiakun1, XIAO Han1, LI Jingmin3
1. School of Materials Science and Engineering,Kunming University of Science and Technology,Kunming 650093,China; 2. Analysis and Testing Research Center,Kunming University of Science and Technology,Kunming 650093,China; 3. Yunnan Ledford Technology Corperation Limited,Kunming 650093,China
Abstract：The influence of background noise on trace phase identification in X-ray diffraction (XRD) was focused in this study. The results showed that background noise could be divided into two parts: noise amplitude and noise fluctuation. The noise fluctuation could be further classified into three types:peaks,valleys,and platforms. According to the comparison of noise fluctuation, it was still possible to carry out match analysis using 3 strongest lines, 5 strongest lines, and so on of trace phase cards and confirm trace phase composition. On the basis of this, weak diffraction signals provided by trace CaCO3 phase was qualitatively characterized. It was found that 3 strongest lines, 5 strongest lines, even 8 strongest lines in CaCO3 phase card (PDF# 00-047-1743) were one-to-one matched with peaks or platforms of background noise, and the notable diffraction lines in other phase cards could not meet “one-to-one matched with the peaks or platforms”. The results well verified the role of background noise in trace phase identification and analysis.
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