Abstract:The development of reference materials required the comprehensive applications of various high-precision and high-accuracy methods, especially the homogeneity and stability test after sample grinding, and the high-precision of the analytical method. X-ray fluorescence spectrometry (XRF) was the most accurate analytical method for the major and minor components of geological materials, and it was a non-polluting multi-element analysis method, so it was widely used in the development of geological reference materials and played an important role. The paper reviewed the applications of XRF in the development of geological reference materials from the aspects of sample uniformity, stability, multi-element constant value analysis and standard analysis method formulation, and also introduced the application of XRF in the formulation of national and industrial standard analysis. The paper especially introduced the important discovery of XRF in the testing of homogeneity, and the non-uniformity error of samples had become an important source of modern geological analysis error, and put forward to reduce the particle size of samples (including reference materials) from the historical evolution that the particle size of geological analysis samples decreased with the progress of analysis technology. So that it could be adapted to these techniques, such as XRF, inductively coupled plasma atomic emission spectrometry (ICP-AES)/inductively coupled plasma mass spectrometry (ICP-MS). The paper also reviewed the research work on the development of ultra-fine reference materials and the analysis of ultra-fine samples, and briefly described the significance of the research and its possible impact on the development of the whole geological analysis. The research work of NIST in this field indicated that the development of superfine reference materials and the analysis of superfine samples would be an important direction in the development of geological analysis. There were 125 citations in the paper.
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